United States
United States
This training will help in brushing up technical test analyst's skills. The course includes white-box test design, risk-based testing, and dynamic and static analysis techniques. Students will be able to scrutinize quality characteristics including; security, reliability, efficiency (performance, stress, and load) and portability testing. Students will also be able to learn how to choose suitable tools to computerize technical testing tasks such as web-based testing, performance and unit testing. During this training, students will be provided with the exercises, learning tools and various sample exam questions.
| Live Online Training (Duration : 32 Hours) | |||
|---|---|---|---|
|
|||
|
Classroom Training is available. Enquire for the fee Click
|
Ultra-Fast Track
If you can't spare 32 hours. We can offer you an Ultra-Fast Track for 16 hours for only USD 1,280 |
||
This course is designed for anyone who is working in software testing who have achieved an advanced point in their career. Course Objectives: Classify and recognize the typical risks associated with the security, performance, portability, and reliability of software systems. Build test plans which detail the planning, execution and design of tests for mitigating performance, reliability, security, and portability risks. Select and execute suitable structural design techniques to make sure that tests give a sufficient level of confidence, based on code coverage and design coverage. Suggest improvements to the maintainability, security, and testability of code by executing static analysis. Participate in technical reviews with software architects and developers applying knowledge of typical mistakes made in architecture and code.
Give an edge to your career with BCS-ISTQB certification training courses. Students can join the classes for ISTQB-BCS Certified Tester Advanced Level Technical Test Analyst(CTAL-TTA) Training Course at Koenig Campus located at New Delhi, Bengaluru, Shimla, Goa, Dehradun, Dubai & Instructor-Led Online.
